Login Preferences
About News Publications Statistics Downloads API Guide License How to use Preferences
bn:01504187n
Noun Concept
FR
No term available
EN
Kelvin probe force microscopy, also known as surface potential microscopy, is a noncontact variant of atomic force microscopy. Wikipedia
Relations
Sources
IS A
microscope à force atomique
NAMED AFTER
William Thomson

Please note that, in order to improve your browsing experience on this website, BabelNet® uses various types of cookies, including: browsing functionality, performance and statistical cookies.

By continuing to browse the site you are agreeing to our use of cookies. OK

License