bn:01591108n
Noun Concept
Categories: Intermolecular forces, Semiconductor analysis, Swiss inventions, Scanning probe microscopy, American inventions
EN
atomic force microscope  atomic force microscopy  AFM  AFM in Bio  AFM microscopy
EN
Atomic force microscopy or scanning force microscopy is a very-high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Wikipedia
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EN
Atomic force microscopy or scanning force microscopy is a very-high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Wikipedia
A high-resolution type of scanning probe microscope Wikipedia Disambiguation
Very high-resolution type of scanning probe microscope Wikidata
A device used to map the atomic structure of a surface by measuring the force acting on the very fine tip of a wire moved over the surface. Wiktionary