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bn:02342949n
Noun Concept
Categories: Scientific techniques, Semiconductor device fabrication, Electron microscopy, Thin film deposition
EN
focused ion beam  Focussed ion beam  FIB
EN
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. Wikipedia
Definitions
Relations
Sources
EN
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. Wikipedia
device Wikidata
IS A
ion beam
DIFFERENT FROM
fast-atom bombardment
Wikipedia
EN
focused ion beam
Wikidata
EN
focused ion beam
Wikipedia Redirections
EN
Focussed ion beam, Focussed Ion Beam (FIB)
Wikidata Alias
EN
FIB

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